작성일 : 13-01-02 15:04
Nanoscan, non-contact type.bmp
[0]
DATE : 2013-01-02 15:04:03
분류 : measurement
Nanoscan, non-contact type
Place
계측실
Dealer
나노시스템
Date
2004.11.17
Project Name
Purpose
샘플의 거칠기 및 두께 측정
Responsible Person
박종성
A list of additional components
Detailed specification
샘플의 표면을 높은 분해능(~2nm) 으로 분석 및 측정
-Inter ferometric objectives: single lens available
-Scanrange: 0-180um(option270um)
-Vertical resolution: WSI: <0.5nm/PSI: 0.1nm>
-Stagetilt : ±3
-Z stroke: 30mm(manual)
-Workpiece stage: 50*50mm(manual)