작성일 : 13-01-02 17:45
 Atomic Force Microscope.bmp [0] DATE : 2013-01-02 17:45:01 | ||||||||||||||||
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 A list of additional components |
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Detailed specification Not allowed to use AFM except a person who is a responsible.
샘플표면을 원자수준으로 이미지 및 마이크로/나노 패턴 형성
-SPM controller and Data acquisition system -X,Y flexture 100um scanner with closed - loop feedback control -Scanning 12um manual micro meter -25mm X,Y manual micrometer -Active Vibration isolation system -Enhance acousitic enclosure with steel frame -Enhance EFM -Nanolithography |
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Atomic Force Microscope![Atomic Force Microscope.bmp [0] DATE : 2013-01-02 17:45:01](javascript:file_download('./download.php?bo_table=Fabrication&wr_id=311&no=0&sca=measurement', 'Atomic Force Microscope.bmp');){kind=link}
